Mfg Part Number: 192015P1 | NSN : 5961-00-938-1135 | NIIN : 009381135 | CAGE Code : 31637 | Manufacturer: Bae Systems Information And Electronic Systems Integration I Div Microwave Elect | Item Name : Semiconductor Device Diode | FSC : 5961 Semiconductor Devices and Associated Hardware |
We appreciate your interest in part 192015P1 of Semiconductor Device Diode. This item, manufactured by Bae Systems Information And Electronic Systems Integration I Div Microwave Elect with the NSN 5961-00-938-1135, is readily available for immediate purchase. If you would like to receive a personalized quote for comparison, please fill out the Instant RFQ form provided and submit it through this website. Once we have received your request, we will assign an account manager who will formulate a quote in 15 minutes or less and answer any questions.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-00-938-1135 Item Description: Semiconductor Device Diode | 5961 | 009381135 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
192015p1 | 3 | 1 | C | A |
MRC | Criteria | Characteristic |
---|---|---|
SR-1 | SPEC/STD CONTROLLING DATA | |
ABHP | OVERALL LENGTH | 0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
AXGY | MOUNTING METHOD | TERMINAL |
TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
SR-1 | DEFINITIVE GOVERNMENT SPEC/STD REFERENCE | JAN1N4148 |
CTQX | CURRENT RATING PER CHARACTERISTIC | 2.00 AMPERES MAXIMUM PEAK FORWARD SURGE CURRENT |
SR-1 | NON-DEFINITIVE GOVERNMENT SPEC/STD REFERENCE | MIL-PRF-19500/116 |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 100.0 MAXIMUM BREAKDOWN VOLTAGE, DC AND 75.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE |
SR-1 | MANUFACTURERS CODE | 81349 |
ABBH | INCLOSURE MATERIAL | GLASS |
ABJT | TERMINAL LENGTH | 1.500 INCHES MAXIMUM |
ADAV | OVERALL DIAMETER | 0.056 INCHES MINIMUM AND |
SR-1 | DEFINITIVE GOVERNMENT SPEC/STD REFERENCE OR MANUFACTURERS CODE | |
TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 DEG CELSIUS JUNCTION |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/116 GOVERNMENT SPECIFICATION |
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